Experience on Safety, Expulsion, and Complication of Intracesarean Post-Partum Intrauterine Copper Device

Soniya Vishwakarma; Vandana Verma; Mamta Singh; Nupur Mittal; Soniya  Vishwakarma; Vandana Verma; Mamta  Singh; Nupur Mittal

doi:10.7759/cureus.10647

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